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QBT-A High Vacuum Plasma-enhanced ALD System

YunmaoProduct Overview

The QBT-A system is specially designed for low oxygen containment thin film deposition applications, especially suitable for TiN deposition, such as ultra-low loss RF circuits, TSV filling processes. The unique design minimizes the oxygen content in the process chamber.

YunmaoTechnical Advantages

Ultimate Pressure: <5E-8Torr

Plasma: 600W max. RF auto-matching power supply

Max Wafer Size: Ф200mm, AL2O3 Uniformity<1%

Wafer Heating: RT-500±1ºC

Max Precursor: Up to 3 plasma reactive gases and 4 liquid/solid precursor sources

Ozone Generator: Configurable, production rate: 15 g/h

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Application

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Micro/nano-optoelectronics

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Optical Thin Films

FAQ

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What processes can QBT-A perform?

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Nitride: TiN, SiN, AlN, NbN, etc., Oxide: SiO2, Al2O3, HfO2, TiO2, etc.; Mo, Cu

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What is the maximum wafer size that the QBT-A system can process?

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Max 8 inch wafer and smaller chips compatible

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How low can the room-temperature resistivity of PE-TiN be achieved with the QBT-A system?

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The 30nm PE-TiN film achieves a room-temperature resistivity of ≤70 μΩ·cm.

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What is the maximum superconducting critical temperature achievable for NbN thin films deposited by the QBT-A system?

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20nm NbN, Tc=14K

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