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ALD

ALD (atomic layer deposition) is a specialized chemical vapor deposition technique that deposit thin films by alternately pulsing gaseous precursors onto the substrate in the reaction chamber, where they chemically adsorb and react on the substrate surface.

The classic reaction between TMA and H2O to form aluminum Al2O3:

Half-reaction a: -OH∗ + Al(CH3)3(g ) → - O - Al(CH3)2∗ + CH4(g)

Half-reaction b: - O - Al(CH3)2 + 2H2O(g) → - O - Al(OH)2∗ + 2CH4(g)

Reaction: 2Al(CH3)3 + 3H2O → Al2O3 + 6CH4

Atomic Layer Deposition (ALD), as an advanced chemical vapor coating technology, enables conformal coating on irregular surfaces of substrate materials with the following characteristics::

▪ Linear and controllable coating thickness: 0.1–0.2 nm/cycle

▪ Uniform and dense coating layers

▪ Low-temperature growth (some films can be deposited at room temperature)

▪ Growth of multi-component layered structures

▪ Diverse coating material options

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